Yuelin Xiong (28min)

Oxford Suzhou Centre for Advanced Research, University of Oxford

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Abstract

Understanding contact interfaces is important for improving the performance, reliability and sustainability of high-efficiency solar cells. Processes occurring at these interfaces, from atomic-scale dopant distributions to changes in metal–silicon contacts, can strongly influence the electrical properties of the device.

In my talk, I will discuss how electrical measurements combined with advanced materials characterisation can be used to understand the behaviour of these interfaces. I will first discuss how atom probe tomography (APT) can be used to probe atomic-scale dopant and hydrogen distributions in indium-free, ZnO-based transparent conducting oxides, and how these distributions relate to their electrical properties and thermal stability. I will then examine the long-term reliability of contacts treated using Laser Enhanced Contact Optimisation (LECO) and discuss a degradation mechanism associated with changes at the metal–silicon interface. Finally, I will show how copper-induced recombination losses in silicon can be substantially recovered through thermal and voltage-assisted treatments, providing new insights into the use of copper as a more sustainable alternative to silver metallisation.

Brief Bio

Yuelin studied Materials Science at the University of Oxford, where she received her MEng in 2023. She is currently a PhD student in the Department of Materials under the supervision of Assoc. Prof. Sebastian Bonilla. Her research focuses on understanding and improving contact structures for sustainable terawatt-scale solar energy through advanced materials characterisation.