Abstract
Photoluminescence imaging on large area silicon solar cells and wafers was first developed and demonstrated at the University of New South Wales. The first journal publication on this topic was published in 2006; in 2016 we are thus celebrating the 10th birthday of PL imaging. Over the last ten years PL imaging has been widely adopted and is now used routinely on a daily basis in PV R&D and for quality control and process monitoring in mass production. We review and discuss the history of the development of PL measurement techniques, including a number of quantitative analysis methods and applications. Researchers from a number of PV R&D groups worldwide have contributed to an impressively large body of research and of publications in this field. The focus of this presentation however, will be on previous and ongoing work at UNSW, where current projects aim at further broadening our fundamental understanding of photoluminescence emission from silicon devices, at expanding the application of PL techniques to a wider range of sample types and at developing entirely new PL imaging based analysis methods.
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Brief Bio
Thorsten Trupke is a semiconductor physicist with more than 15 years’ experience in research and development in the PV sector, with emphasis on novel characterization methods. Thorsten is a Professor at the School for Photovoltaic and Renewable Energy Engineering at the University of New South Wales and also co-founder and CTO of BT Imaging, a UNSW start-up company that commercializes photoluminescence imaging inspection systems.
