UNSW School of Photovoltaic & Renewable Energy Engineering |
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John Murphy (57Min)
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Abstract Minority carrier lifetime is the key property of silicon substrates for all types for photovoltaic cells. As well as being a useful figure of merit, the dependence of lifetime on excess carrier density can, in well controlled sample sets, reveal a great deal about the physics of the recombination processes.
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| Brief Bio Dr John Murphy studied Physics at the University of Oxford (UK), followed by a doctorate in Materials Science at Oxford which he completed under the supervision of Prof. Peter Wilshaw in 2006. His doctoral work, part-funded by MEMC (now SunEdison), focussed on the fundamental properties of oxygen and nitrogen in silicon for integrated circuit applications. After a postdoc working on the mechanical properties of BCC metals for nuclear fusion applications, he was awarded a five Royal Academy of Engineering/ EPSRC Research Fellowship at Oxford to work on silicon materials for photovoltaics. He moved to a faculty position at the University of Warwick in early 2013, and is now an Associate Professor (Senior Lecturer) in the School of Engineering. He currently leads the £1.6m EPSRC SuperSilicon PV project, which unites the UK’s silicon PV materials work at Warwick, Manchester and Oxford. |