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Abstract
In the photovoltaic industry, achieving a low levelized cost of electricity (LCOE) requires high efficiency and long module lifetimes, with annual degradation rates below 0.5%. In this presentation, we will focus on corrosion-induced degradation in silicon heterojunction (SHJ) and tunnel oxide passivated contact (TOPCon) technologies. Using advanced accelerated testing, we identify sodium, soldering flux, and encapsulant additives as key contaminants causing performance losses that can exceed 50% after standard damp-heat testing. We will show that barrier layers can improve SHJ reliability, while the laser-assisted firing of aluminium-free pastes enhances TOPCon durability.
Strategies for degradation prevention and global-scale modelling are also presented.
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Brief Bio
Short Biography:
Professor Bram Hoex obtained his MSc and PhD degrees from Eindhoven University of Technology, Netherlands, in 2003 and 2008, respectively.
From 2008 to 2015, he served first as Group Leader and subsequently as Director at the Solar Energy Research Institute of Singapore (SERIS), NUS. In 2015, he joined the School of Photovoltaic and Renewable Energy Engineering (SPREE) at UNSW, where he currently
holds positions as Professor and Deputy Head of School (Research). His research encompasses nanoscale thin films for renewable energy, solar cell reliability, large-scale solar farm modelling, and applying artificial intelligence in materials science. He is
widely recognised for pioneering aluminium oxide surface passivation technologies for PERC and TOPCon solar cells. Professor Hoex has published over 300 articles and received several prestigious awards, including the SolarWorld Junior Einstein Award and the
IEEE PVSC Young Professional Award. In 2018, he was recognised globally in Renewable Energy World’s “Solar 40 under 40”.
Link to the UNSW Hoex Group Website
Link to related publications
